New Method for Generating Test Codes to Detect Multiple Stuck-at-Faults in Combinational Circuits. Part 1
DOI:
https://doi.org/10.15407/intechsys.2025.02.034Keywords:
combinational circuit, single and multiple stuck-at-faults (0/1) type damage, q-partition of minterms, nonessential variables, vector of test codesAbstract
The article is devoted to a new method of generating test codes to detect multiple damages in digital combinational circuits, which is based on the artificial introduction of nonessential variables and the application of the procedure of q-partition of minterms of a given function. Due to the use of a numerical set-theoretic approach, the proposed method differs from the known ones in a relatively simpler practical implementation to detect stuck-at-faults (0/1) type both at one point and at several points simultaneously of the circuit under study.
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