Sample Preparation for Translucent and Scanning Electron Microscopy: New Leica Microsystems Coaters

Authors

  • S.V. Niemova INTERO Ltd., Kyiv

DOI:

https://doi.org/10.15407/scine10.02.050

Keywords:

automatic control, electron microscopy, microstructure analysis, nanotechnology, replica, vacuum level

Abstract

The research deals with new Leica Microsystems desktop coaters used for application of conductive layers in vacuum. Their technical specifications and scope of application have been described.

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Published

2024-08-12

How to Cite

Niemova, S. (2024). Sample Preparation for Translucent and Scanning Electron Microscopy: New Leica Microsystems Coaters. Science and Innovation, 10(2), 50–54. https://doi.org/10.15407/scine10.02.050

Issue

Vol. 10 No. 2 (2014): Science and Innovation

Section

The World of Innovation

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