Sample Preparation for TEM and FESEM: New Generation Coaters from Leica Microsystems

Authors

  • S.V. Niemova “INTERO” Ltd., Kyiv

DOI:

https://doi.org/10.15407/scin10.02.055

Keywords:

nanotechnology, electron microscopy, microstructure analysis, replica, automatic control, vacuum level.

Abstract

The article informs about new desktop coaters for ap p lication of conductive layers in vacuum from Leica Mic ro systems. There are information about technical data and field of application of the coaters.

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Published

2024-06-12

Issue

Vol. 10 No. 2 (2014): Our Authors

Section

The World of Innovations