Position-Sensitive Silicon Detector for X-ray Difractometry of Fast Transient Processes

Authors

  • V.M. Pugatch Institute for Nuclear Research of NAS of Ukraine, Kyiv

DOI:

https://doi.org/10.15407/scin10.02.027

Keywords:

position-sensitive detectors, silicon micropixel detector TіmePіx, microstrip metal detectors, high-speed X-ray radiography, the dynamics of phase transformations.

Abstract

The results of the development and application of position sensitive microdetectors to study dynamics of fast transient processes in metals and alloys under heating/cooling by means of high-speed radiography are presented.

References

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Published

2024-06-12

Issue

Section

The World of Innovations