The Low-Temperature Device for Microwave Non-Destructive Defectoscopy

Authors

  • I.P. Zharkov Institute of Physics, NAS of Ukraine, Kiev
  • O.M. Ivashchenko Institute of Physics, NAS of Ukraine, Kiev
  • E.M. Rudenko Institute of Metal Physics, NAS of Ukraine, Kyiv
  • I.V. Korotash Institute of Metal Physics, NAS of Ukraine, Kyiv
  • A.A. Krakovnyy Institute of Metal Physics, NAS of Ukraine, Kyiv
  • V.V. Safronov Institute of Physics, NAS of Ukraine, Kiev
  • V.A. Khodunov Institute of Physics, NAS of Ukraine, Kiev
  • А.E. Rudenko International Center for Electron Beam Technologies of Electric Welding Institute, NAS of Ukraine, Kyiv

DOI:

https://doi.org/10.15407/scin9.03.013

Keywords:

microwave non-destructive defectoscopy, nitrogen cryostat, scanner.

Abstract

 The new device for microwave non-destructive defectoscopy with minimum thermal noises and increased signal /noise ratio, which used scanning nitrogen filled cryostat with integrated active microwave elements, is designed.

References

Sistema nerazrushajushhego kontrolja. Vidy (metody) i tehnologija nerazrushajushhego kontrolja. Spravochnoe posobie. Ser. 28, vypusk 4. Moskva: GUP «Nauchno-tehnicheskij centr po bezopasnosti i promyshlennosti Gostehnadzora Rossii», 2003. 97 s. [in Russian].

Ermolov I.N., Ostanin Ju.Ja. Metody i sredstva nerazrushajushhego kontrolja kachestva. Moskva: Vysshaja shkola, 1988. 368 s. [in Russian].

Zharkov I.P., Zhirko Ju.I., Maslov V.A. i dr. Malogabaritnoe ustrojstvo ohlazhdenija fotojelektronnyh umnozhitelej. Nauchnoe priborostroenie. 2011. T. 21. No. 1. S. 120-124 [in Russian].

Zharkov I.P., Korotash I.V., Rudenko Je.M. i dr. Sposob radiovolnovogo nerazrushajushhego kontrolja i ustrojstvo dlja ego primenenija. Zajavka RF na izobretenie 2011107975/07 ot 01.03.20011, data publikacii 10.09.2012 [in Russian].

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Published

2024-06-10

Issue

Vol. 9 No. 3 (2013): Science and Innovation

Section

Scientific Framework of Innovation Activities