An Instrument for Control of X-ray Emitters’ Parameters

Authors

  • V.D. Ryzhikov Institute for Scintillation Materials, NAS of Ukraine, Kharkiv
  • B.V. Grinyov Institute for Scintillation Materials, NAS of Ukraine, Kharkiv
  • V.G. Volkov Institute for Scintillation Materials, NAS of Ukraine, Kharkiv
  • E.K. Lisetskaya Institute for Scintillation Materials, NAS of Ukraine, Kharkiv
  • S.V. Makhota Institute for Scintillation Materials, NAS of Ukraine, Kharkiv
  • E.V. Popkova Institute for Scintillation Materials, NAS of Ukraine, Kharkiv

DOI:

https://doi.org/10.15407/scin9.02.036

Keywords:

X-ray radiation, anode voltage, dose, detector.

Abstract

A non-contact measuring method of X-ray tube voltage, exposure dose rate and exposure dose is proposed. It is based on the use of original two-energy X-ray detector. Measurement of accelerating voltages in the range from 40 to 150 kV and dose rate measurements with increased accuracy, which is achieved due to the special shape of the spectral sensitivity characteristics of detector elements, are simulated on a device scale-model.

References

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Patent 44 547A Ukrainy. Detektirujushhaja sistema dlja rentgenovskoj introskopii. V. Ryzhikov, N. Starzhinskij, L. Gal'chineckij i dr. Opubl. 15.02.2002. Bjul. No. 2 [in Russian].

Rentgenotehnika: Spravochnik. V 2-h kn. 1. V.V. Kljuev, F.R. Sosnin, V. Aerts i dr.; Pod obshh. red. V.V. Kljueva. 2-e izd., pererab. O dop. Moskva: Mashinostroenie, 1992. 480 s. [in Russian].

Published

2024-06-10

Issue

Section

The World of Innovations