Transmission Electron Microscopy Past and Present: Pushing the Limits of Cognition
DOI:
https://doi.org/10.15407/scin8.02.039Keywords:
transmission electron microscopy, aberration correction, atomic resolution, single atom identification.Abstract
The paper gives a brief review of the principal milestones of development of electron microscopy. Main attention is paid to the most advanced achievements in technique of transmission electron microscopy. Described are the state of the-art microscopes with 5th order aberration correction giving images with sub-angstrom spatial resolution.
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