Multifunction Scanning Probe Microscope with Diamond Tip. Nanotechnological Research at Ambient Conditions
DOI:
https://doi.org/10.15407/scin8.02.008Keywords:
scanning probe microscopy probe nanotechnology, conductive diamond.Abstract
The author’s design of scanning probe microscope (SPM), which combines surface scanning and modifications is presented. The features of the device are boron doped diamond tip, and electromagnetic mechanism to measure the level of loads during nanointeractions between the tip and the sample surface. The techniques of combined nanotechnology research of thin films and the results of the formation of surface nanostructures with contact method are shown.
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