Field Type Ion Injector

Authors

  • V.I. Vozny
  • V.Yu. Storizhko
  • V.I. Miroshnichenko
  • V.V. Tokman
  • Ye.A. Mironets
  • Ye.O. Batura

DOI:

https://doi.org/10.15407/scin6.05.072

Keywords:

brightness, emission, focused ion beam, gas field ion source

Abstract

To improve the spatial resolution of FIB systems, field type ion injector has been developed. Measurements of the injector parameters are performed on the high-vacuum stand with a residual pressure about 5 ⋅ 10-7 Pa. Ion injector consists of a needle-in-capillary type gas field ion source, focusing einzel lens and compact Wien filter with permanent magnets. The field ion source design provides the possibility of cooling the tungsten needle to a liquid nitrogen temperature. Currentvoltage characteristics of the ion source operating at room temperature have been measured. Ion field emission current up to (1-5)•10-12 A at 2-5 kV emission voltage is obtained.

References

Szymanski R., Jamieson D.N. Ion source brightness and nuclear microprobe applications. Nucl. Instrum. Meth. B. 1997. V. 130. P. 80-85.

https://doi.org/10.1016/S0168-583X(97)00268-1

Jamieson D.N. New generation nuclear microprobe systems. 7 Intern. Conference on Nuclear Microprobe Technology and Applications. France. 10 September. 2000. MF-01. P. 1-16.

Lejeune C. and Aubert J. Emittance and brightness: definitions and measurements. Advances in Electronics and Electron Physics. part 13A. Septier: New York, 1980. P. 159-259.

Storizhko V.E., Ponomarev A.G. et al. The Sumy scanning nuclear microprobe: Design features and first tests. Nucl. Instrum. Meth. B. 2007. V. 260. P. 49-54.

https://doi.org/10.1016/j.nimb.2007.01.250

Legge G.J.F., Moloney G.R., Colman R.A. and Allan G.L. High velocity ion microprobes and their source requirements. Rev. Sci. Instrum. 1996. V. 67. No. 3. P. 909-914.

https://doi.org/10.1063/1.1147231

Bell A.E., Jousten K. and Swanson L.W. High-field ion sources. Rev. Sci. Instrum. 1990. V. 61. No. 1. P. 363-365.

https://doi.org/10.1063/1.1141294

Orloff J.H. and Swanson L.W. Study of a field-ionization source for microprobe applications. J. Vac. Sci. Technol. 1975. V. 12. P. 1209-1213.

https://doi.org/10.1116/1.568497

Tondare V.N. Quest for high brightness, monochromatic noble gas ion sources. J. Vac. Sci. Technol. A. 2005. V. 23. No. 6. P. 1498-1508.

https://doi.org/10.1116/1.2101792

Edinger K., Yun V., Melngailis J., Orloff J., Magera G. Development of a high brightness gas field ion source. J. Vac. Sci. Technol. B. 1997. V. 15. No. 6. P. 2365-2368.

https://doi.org/10.1116/1.589648

Konishi M., Takizawa M. and Tsumori T. Characteristics of a helium field ion gun. J. Vac. Sci. Technol. B. 1988. V. 6. P. 498-501.

https://doi.org/10.1116/1.584051

Salancon E., Hammadi Z., Morin R. A new approach to gas field ion sources. Ultramicroscopy. 2003. V. 95. P. 183-188.

https://doi.org/10.1016/S0304-3991(02)00315-7

Mikhailovskij I.M., Wanderka N., Storizhko V. et all. A new approach for explanation of specimen rupture under high electric field. Ultramicroscopy. 2009. V. 109. P. 480-485.

https://doi.org/10.1016/j.ultramic.2008.12.003

Muller E.W., Tsong T.T. Field Ion Microscopy, Principles and Applications. Elsevier: New York, 1969. P. 314.

Korol' Je.N., Lobanov V.V, Nazarenko V.A., Pokrovskij V.A. Fizicheskie osnovy polevoj mass-spektrometrii. Kyiv: Nauk. dumka, 1978 [in Russian].

Published

2024-05-30

Issue

Section

Scientific Framework of Innovation Activities