PUGATCH, V. Position-Sensitive Silicon Detector for X-Ray Difractometry of Rapid Processes. Science and Innovation, [S. l.], v. 10, n. 2, p. 25–30, 2024. DOI: 10.15407/scine10.02.025. Disponível em: https://nasu-periodicals.org.ua/index.php/science/article/view/5937. Acesso em: 23 dec. 2024.