Rytsar B. New Method for Generating Test Codes to Detect Multiple Stuck-at-Faults in Combinational Circuits. Part 2. Inf.Tech.&Syst. [Internet]. 2025 Sep. 22 [cited 2026 Apr. 30];3(3):3-29. Available from: https://nasu-periodicals.org.ua/index.php/its/article/view/19407