Rytsar B. New Method for Generating Test Codes to Detect Multiple Stuck-at-Faults in Combinational Circuits. Part 1. Inf.Tech.&Syst. [Internet]. 2025 Jul. 17 [cited 2026 May 8];2(2):34-5. Available from: https://nasu-periodicals.org.ua/index.php/its/article/view/15347