RYTSAR, B. New Method for Generating Test Codes to Detect Multiple Stuck-at-Faults in Combinational Circuits. Part 2. Information Technologies and Systems, [S. l.], v. 3, n. 3, p. 3–29, 2025. DOI: 10.15407/intechsys.2025.03.003. Disponível em: https://nasu-periodicals.org.ua/index.php/its/article/view/19407. Acesso em: 30 apr. 2026.