RYTSAR, B. New Method for Generating Test Codes to Detect Multiple Stuck-at-Faults in Combinational Circuits. Part 1. Information Technologies and Systems, [S. l.], v. 2, n. 2, p. 34–54, 2025. DOI: 10.15407/intechsys.2025.02.034. Disponível em: https://nasu-periodicals.org.ua/index.php/its/article/view/15347. Acesso em: 8 may. 2026.