GAIDAR, G. . Peculiarities of changes in the structure and electrophysical characteristics of n-Si under the effect of various thermal treatment regimes . Reports of the National Academy of Sciences of Ukraine, Kyiv, Ukraine, n. 5, p. 42–51, 2024. DOI: 10.15407/dopovidi2020.05.042. Disponível em: https://nasu-periodicals.org.ua/index.php/dp/article/view/2020-5-5. Acesso em: 12 may. 2025.